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Photoveel II and Photoveel II-S
Machinable Nitride Ceramics

Photoveel II and Photoveel II-S are the enabling materials for the next generation probe card. Holes with diameters as small as 40 microns and 60 micron pitch can be drilled into Photoveel II and II-S.

Photoveel II series materials feature a fine grain structure with excellent mechanical properties that enable precision features, high hole density, and hole diameters down to 30µm. Best of all, Photoveel II is available in a wide range of CTEs (coefficient of thermal expansion).

Applications

  • Various Inspection Parts
  • Insulation parts with micro structure
  • Lens holder (low reflectance)
Photoveel II Ceramics
Ceramics Lens Holder Ceramics

Photoveel II Ceramics

Ceramic Hole Photo

Properties

      Photoveel II Photoveel II-S Photoveel II-K70
General Properties Characteristics High strength High strength High strength
High thermal
conductivity
Main Component Purity (wt%) - - -
Color Light Gray Light Gray/Black Light Gray
Density (g/cm3) 2.56 3.5 2.7
Water Absorption (%) 0 0 0
Mechanical Properties Bending Strength (MPa) 440 320 520
Young's Modulus (GPa) 157 130 200
Vickers Hardness (GPa) 2.3 2.3 4
Thermal Properties Max.Operating Temperature (°C) 1000
(In nonoxidizing atmosphere)
1000
(In nonoxidizing atmosphere)
1000
(In nonoxidizing atmosphere)
Coefficient of Thermal Expansion (1/°C×10-6) 1.4 (RT~400°C) 4.7 (RT~150°C) 1.0 (RT~150°C)
Coefficient of Thermal Conductivity (W/m×K) 50 23 70
Thermal Shock Resistance ΔT (°C) 600 400 -
Electrical Properties Volume Resistivity 25°C 1015 1015 1015
300°C - - -
500°C - - -
800°C - - -
Dielectric Constant 10GHz 5.5 9 5.9
Dielectric Loss (×10-4) 10 25/16 11
Q Factor (×104) 0.1 0.04/0.06 0.09
Dielectric Breakdown Voltage (KV/mm) 35 30/>20 18